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* Adopt ESP32 test driver to pw_unit_test output
* Link ESP32 tests with ToString(CHIP_ERROR, ...) wrapper
* Fix segfault
* Fix CHIP stack initialization when running tests
* [ESP32] Do not delete default event loop
The PlatformManagerImpl::_InitChipStack() does not create default event
loop, so the PlatformManagerImpl::_Shutdown() shall not delete it.
* Fix MultiBufferEncode test with pool allocator
* Include TestWriterReserve test only for heap allocator
* Disable buffer use check for LWIP pool
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