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TestFailSafeContext.cpp
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/*
*
* Copyright (c) 2020-2022 Project CHIP Authors
*
* Licensed under the Apache License, Version 2.0 (the "License");
* you may not use this file except in compliance with the License.
* You may obtain a copy of the License at
*
* http://www.apache.org/licenses/LICENSE-2.0
*
* Unless required by applicable law or agreed to in writing, software
* distributed under the License is distributed on an "AS IS" BASIS,
* WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
* See the License for the specific language governing permissions and
* limitations under the License.
*/
/**
* @file
* This file implements a unit test suite for the Configuration Manager
* code functionality.
*
*/
#include <inttypes.h>
#include <stdarg.h>
#include <stdio.h>
#include <stdlib.h>
#include <string.h>
#include <pw_unit_test/framework.h>
#include <app/FailSafeContext.h>
#include <lib/core/StringBuilderAdapters.h>
#include <lib/support/CHIPMem.h>
#include <lib/support/CodeUtils.h>
#include <lib/support/DefaultStorageKeyAllocator.h>
#include <lib/support/TestPersistentStorageDelegate.h>
#include <platform/CHIPDeviceLayer.h>
using namespace chip;
using namespace chip::Logging;
using namespace chip::DeviceLayer;
namespace {
constexpr FabricIndex kTestAccessingFabricIndex1 = 1;
constexpr FabricIndex kTestAccessingFabricIndex2 = 2;
class TestFailSafeContext : public ::testing::Test
{
public:
static void SetUpTestSuite()
{
ASSERT_EQ(chip::Platform::MemoryInit(), CHIP_NO_ERROR);
ASSERT_EQ(PlatformMgr().InitChipStack(), CHIP_NO_ERROR);
}
static void TearDownTestSuite()
{
PlatformMgr().Shutdown();
chip::Platform::MemoryShutdown();
}
};
// =================================
// Unit tests
// =================================
TEST_F(TestFailSafeContext, TestFailSafeContext_ArmFailSafe)
{
chip::TestPersistentStorageDelegate testStorage;
chip::app::FailSafeContext failSafeContext;
failSafeContext.Init({ &testStorage });
EXPECT_EQ(failSafeContext.ArmFailSafe(kTestAccessingFabricIndex1, System::Clock::Seconds16(1)), CHIP_NO_ERROR);
EXPECT_TRUE(failSafeContext.IsFailSafeArmed());
EXPECT_EQ(failSafeContext.GetFabricIndex(), kTestAccessingFabricIndex1);
EXPECT_TRUE(failSafeContext.IsFailSafeArmed(kTestAccessingFabricIndex1));
EXPECT_FALSE(failSafeContext.IsFailSafeArmed(kTestAccessingFabricIndex2));
EXPECT_FALSE(testStorage.SyncDoesKeyExist(DefaultStorageKeyAllocator::FailSafeAddNOCStartedMarkerKey().KeyName()));
failSafeContext.DisarmFailSafe();
EXPECT_FALSE(failSafeContext.IsFailSafeArmed());
EXPECT_FALSE(testStorage.SyncDoesKeyExist(DefaultStorageKeyAllocator::FailSafeAddNOCStartedMarkerKey().KeyName()));
}
TEST_F(TestFailSafeContext, TestFailSafeContext_AddNocCommandInvoked)
{
chip::TestPersistentStorageDelegate testStorage;
chip::app::FailSafeContext failSafeContext;
failSafeContext.Init({ &testStorage });
EXPECT_EQ(failSafeContext.ArmFailSafe(kTestAccessingFabricIndex1, System::Clock::Seconds16(1)), CHIP_NO_ERROR);
EXPECT_EQ(failSafeContext.GetFabricIndex(), kTestAccessingFabricIndex1);
EXPECT_FALSE(testStorage.SyncDoesKeyExist(DefaultStorageKeyAllocator::FailSafeAddNOCStartedMarkerKey().KeyName()));
failSafeContext.SetAddNocCommandStarted(kTestAccessingFabricIndex2);
EXPECT_EQ(failSafeContext.GetFabricIndex(), kTestAccessingFabricIndex2);
EXPECT_TRUE(testStorage.SyncDoesKeyExist(DefaultStorageKeyAllocator::FailSafeAddNOCStartedMarkerKey().KeyName()));
failSafeContext.SetAddNocCommandInvoked(kTestAccessingFabricIndex2);
EXPECT_TRUE(failSafeContext.NocCommandHasBeenInvoked());
EXPECT_TRUE(failSafeContext.AddNocCommandHasBeenInvoked());
EXPECT_EQ(failSafeContext.GetFabricIndex(), kTestAccessingFabricIndex2);
failSafeContext.DisarmFailSafe();
EXPECT_FALSE(testStorage.SyncDoesKeyExist(DefaultStorageKeyAllocator::FailSafeAddNOCStartedMarkerKey().KeyName()));
}
TEST_F(TestFailSafeContext, TestFailSafeContext_UpdateNocCommandInvoked)
{
chip::TestPersistentStorageDelegate testStorage;
chip::app::FailSafeContext failSafeContext;
failSafeContext.Init({ &testStorage });
EXPECT_EQ(failSafeContext.ArmFailSafe(kTestAccessingFabricIndex1, System::Clock::Seconds16(1)), CHIP_NO_ERROR);
EXPECT_EQ(failSafeContext.GetFabricIndex(), kTestAccessingFabricIndex1);
EXPECT_FALSE(testStorage.SyncDoesKeyExist(DefaultStorageKeyAllocator::FailSafeAddNOCStartedMarkerKey().KeyName()));
failSafeContext.SetUpdateNocCommandInvoked();
EXPECT_TRUE(failSafeContext.NocCommandHasBeenInvoked());
EXPECT_TRUE(failSafeContext.UpdateNocCommandHasBeenInvoked());
EXPECT_FALSE(testStorage.SyncDoesKeyExist(DefaultStorageKeyAllocator::FailSafeAddNOCStartedMarkerKey().KeyName()));
failSafeContext.DisarmFailSafe();
EXPECT_FALSE(testStorage.SyncDoesKeyExist(DefaultStorageKeyAllocator::FailSafeAddNOCStartedMarkerKey().KeyName()));
}
TEST_F(TestFailSafeContext, TestFailSafeContext_NocCommandInvokedTimerExpiry)
{
chip::TestPersistentStorageDelegate testStorage;
chip::app::FailSafeContext failSafeContext;
failSafeContext.Init({ &testStorage });
EXPECT_EQ(failSafeContext.ArmFailSafe(kTestAccessingFabricIndex1, System::Clock::Seconds16(1)), CHIP_NO_ERROR);
EXPECT_EQ(failSafeContext.GetFabricIndex(), kTestAccessingFabricIndex1);
EXPECT_FALSE(testStorage.SyncDoesKeyExist(DefaultStorageKeyAllocator::FailSafeAddNOCStartedMarkerKey().KeyName()));
failSafeContext.SetAddNocCommandStarted(kTestAccessingFabricIndex2);
EXPECT_EQ(failSafeContext.GetFabricIndex(), kTestAccessingFabricIndex2);
EXPECT_TRUE(testStorage.SyncDoesKeyExist(DefaultStorageKeyAllocator::FailSafeAddNOCStartedMarkerKey().KeyName()));
failSafeContext.SetAddNocCommandInvoked(kTestAccessingFabricIndex2);
EXPECT_TRUE(failSafeContext.NocCommandHasBeenInvoked());
EXPECT_TRUE(failSafeContext.AddNocCommandHasBeenInvoked());
EXPECT_EQ(failSafeContext.GetFabricIndex(), kTestAccessingFabricIndex2);
failSafeContext.ForceFailSafeTimerExpiry();
PlatformMgr().ScheduleWork([](intptr_t) -> void { PlatformMgr().StopEventLoopTask(); }, (intptr_t) nullptr);
PlatformMgr().RunEventLoop();
EXPECT_FALSE(testStorage.SyncDoesKeyExist(DefaultStorageKeyAllocator::FailSafeAddNOCStartedMarkerKey().KeyName()));
}
} // namespace