Updated AppContext, LoopbackMessagingContext, and UDPMessagingContext to serve as PW test fixture classes. (#34036)

* Modified MessagingContext and its subclasses as well as AppContext to reflect PW migration.

* Modifed all tests that use LoopbackMessagingContext or AppContext.  Moved LoopbackMessagingContext data to heap.

* Removed unneeded scope from call to parent setup/teardown

* Made some helper functions into class methods.

* Restyled by prettier-markdown

* Reverted TestICDManager back to using LoopbackMessagingContext

* fixing merge conflicts

* fixing merge conflicts

* Fixed duplicate code and missing semicolon

* Trying to update TestReadHandler_DataVersionFiltersTruncated

* Restyled by whitespace

* Restyled by clang-format

* fixed problem with the new TestReadHandler_DataVersionFiltersTruncated

* fix in tracing

* Changes to MessagingContext member variable initialization in response to code review

* Used std::unique_ptr for MessagingContext.mpData

---------

Co-authored-by: Restyled.io <commits@restyled.io>

Author: feasel0

docs/testing/unit_testing.md

@@ -218,8 +218,8 @@ your overriding function make sure to check `HasFailure()` and return if the
 parent function failed.
 
 If you don't override any of the setup/teardown functions, you can simply make a
-type alias: `using YourTestContext = Test::AppContextPW;` instead of defining
-your own text context class.
+type alias: `using YourTestContext = Test::AppContext;` instead of defining your
+own text context class.
 
 ## Best practices
 

src/app/icd/server/tests/TestICDManager.cpp

@@ -15,6 +15,8 @@
  *    See the License for the specific language governing permissions and
  *    limitations under the License.
  */
+#include <pw_unit_test/framework.h>
+
 #include <app/SubscriptionsInfoProvider.h>
 #include <app/TestEventTriggerDelegate.h>
 #include <app/icd/server/ICDConfigurationData.h>
@@ -24,7 +26,6 @@
 #include <app/icd/server/ICDStateObserver.h>
 #include <app/icd/server/tests/ICDConfigurationDataTestAccess.h>
 #include <crypto/DefaultSessionKeystore.h>
-#include <gtest/gtest.h>
 #include <lib/address_resolve/AddressResolve.h>
 #include <lib/core/DataModelTypes.h>
 #include <lib/core/NodeId.h>
@@ -124,18 +125,16 @@ class TestSubscriptionsInfoProvider : public SubscriptionsInfoProvider
     bool mHasPersistedSubscription = false;
 };
 
-System::Clock::Internal::MockClock * pMockClock          = nullptr;
-System::Clock::ClockBase * pRealClock                    = nullptr;
-chip::Test::LoopbackMessagingContext * pMessagingContext = nullptr;
+System::Clock::Internal::MockClock * pMockClock = nullptr;
+System::Clock::ClockBase * pRealClock           = nullptr;
 
 } // namespace
 
 namespace chip {
 namespace app {
 
-class TestICDManager : public ::testing::Test
+class TestICDManager : public Test::LoopbackMessagingContext
 {
-
 public:
     /*
      * Advance the test Mock clock time by the amout passed in argument
@@ -147,7 +146,7 @@ class TestICDManager : public ::testing::Test
     static void AdvanceClockAndRunEventLoop(Milliseconds64 time)
     {
         pMockClock->AdvanceMonotonic(time);
-        pMessagingContext->GetIOContext().DriveIO();
+        GetIOContext().DriveIO();
     }
 
     // Performs shared setup for all tests in the test suite
@@ -159,16 +158,12 @@ class TestICDManager : public ::testing::Test
             ASSERT_NE(pMockClock, nullptr);
         }
 
-        if (pMessagingContext == nullptr)
-        {
-            pMessagingContext = new LoopbackMessagingContext();
-            ASSERT_NE(pMessagingContext, nullptr);
-        }
+        LoopbackMessagingContext::SetUpTestSuite();
+        VerifyOrReturn(!HasFailure());
 
-        pMessagingContext->SetUpTestSuite();
         ASSERT_EQ(chip::DeviceLayer::PlatformMgr().InitChipStack(), CHIP_NO_ERROR);
 
-        DeviceLayer::SetSystemLayerForTesting(&(pMessagingContext->GetSystemLayer()));
+        DeviceLayer::SetSystemLayerForTesting(&GetSystemLayer());
         pRealClock = &SystemClock();
         Clock::Internal::SetSystemClockForTesting(pMockClock);
     }
@@ -180,39 +175,34 @@ class TestICDManager : public ::testing::Test
         DeviceLayer::SetSystemLayerForTesting(nullptr);
 
         DeviceLayer::PlatformMgr().Shutdown();
-        pMessagingContext->TearDownTestSuite();
+
+        LoopbackMessagingContext::TearDownTestSuite();
 
         if (pMockClock != nullptr)
         {
             delete pMockClock;
             pMockClock = nullptr;
         }
 
-        if (pMessagingContext != nullptr)
-        {
-            delete pMessagingContext;
-            pMessagingContext = nullptr;
-        }
-
         pRealClock = nullptr;
     }
 
     // Performs setup for each individual test in the test suite
     void SetUp() override
     {
-        pMessagingContext->SetUp();
+        LoopbackMessagingContext::SetUp();
+        VerifyOrReturn(!HasFailure());
 
         mICDStateObserver.ResetAll();
         mICDManager.RegisterObserver(&mICDStateObserver);
-        mICDManager.Init(&testStorage, &(pMessagingContext->GetFabricTable()), &mKeystore,
-                         &(pMessagingContext->GetExchangeManager()), &mSubInfoProvider);
+        mICDManager.Init(&testStorage, &GetFabricTable(), &mKeystore, &GetExchangeManager(), &mSubInfoProvider);
     }
 
     // Performs teardown for each individual test in the test suite
     void TearDown() override
     {
         mICDManager.Shutdown();
-        pMessagingContext->TearDown();
+        LoopbackMessagingContext::TearDown();
     }
 
     TestSessionKeystoreImpl mKeystore;
@@ -576,8 +566,7 @@ TEST_F(TestICDManager, TestICDCounter)
 
     // Shut down and reinit ICDManager to increment counter
     mICDManager.Shutdown();
-    mICDManager.Init(&(testStorage), &(pMessagingContext->GetFabricTable()), &(mKeystore),
-                     &(pMessagingContext->GetExchangeManager()), &(mSubInfoProvider));
+    mICDManager.Init(&(testStorage), &GetFabricTable(), &(mKeystore), &GetExchangeManager(), &(mSubInfoProvider));
     mICDManager.RegisterObserver(&(mICDStateObserver));
 
     EXPECT_EQ(counter + ICDConfigurationData::kICDCounterPersistenceIncrement,
@@ -982,8 +971,7 @@ TEST_F(TestICDManager, TestICDStateObserverOnICDModeChangeOnInit)
     // Shut down and reinit ICDManager - We should go to LIT mode since we have a registration
     mICDManager.Shutdown();
     mICDManager.RegisterObserver(&(mICDStateObserver));
-    mICDManager.Init(&testStorage, &(pMessagingContext->GetFabricTable()), &mKeystore, &(pMessagingContext->GetExchangeManager()),
-                     &mSubInfoProvider);
+    mICDManager.Init(&testStorage, &GetFabricTable(), &mKeystore, &GetExchangeManager(), &mSubInfoProvider);
 
     // We have a registration, transition to LIT mode
     EXPECT_TRUE(mICDStateObserver.mOnICDModeChangeCalled);

src/app/tests/AppTestContext.cpp

@@ -14,7 +14,7 @@
  *    limitations under the License.
  */
 
-#include <app/tests/AppTestContext.h>
+#include "AppTestContext.h"
 
 #include <access/AccessControl.h>
 #include <access/examples/PermissiveAccessControlDelegate.h>
@@ -40,11 +40,10 @@ namespace Test {
 
 void AppContext::SetUpTestSuite()
 {
-    CHIP_ERROR err = CHIP_NO_ERROR;
     LoopbackMessagingContext::SetUpTestSuite();
-    // TODO: use ASSERT_EQ, once transition to pw_unit_test is complete
-    VerifyOrDieWithMsg((err = chip::DeviceLayer::PlatformMgr().InitChipStack()) == CHIP_NO_ERROR, AppServer,
-                       "Init CHIP stack failed: %" CHIP_ERROR_FORMAT, err.Format());
+    VerifyOrReturn(!HasFailure()); // Stop if parent had a failure.
+
+    ASSERT_EQ(chip::DeviceLayer::PlatformMgr().InitChipStack(), CHIP_NO_ERROR);
 }
 
 void AppContext::TearDownTestSuite()
@@ -67,24 +66,23 @@ void AppContext::TearDownTestSuite()
 
 void AppContext::SetUp()
 {
-    CHIP_ERROR err = CHIP_NO_ERROR;
     LoopbackMessagingContext::SetUp();
-    // TODO: use ASSERT_EQ, once transition to pw_unit_test is complete
-    VerifyOrDieWithMsg((err = app::InteractionModelEngine::GetInstance()->Init(&GetExchangeManager(), &GetFabricTable(),
-                                                                               app::reporting::GetDefaultReportScheduler())) ==
-                           CHIP_NO_ERROR,
-                       AppServer, "Init InteractionModelEngine failed: %" CHIP_ERROR_FORMAT, err.Format());
+    VerifyOrReturn(!HasFailure()); // Stop if parent had a failure.
+
+    ASSERT_EQ(app::InteractionModelEngine::GetInstance()->Init(&GetExchangeManager(), &GetFabricTable(),
+                                                               app::reporting::GetDefaultReportScheduler()),
+              CHIP_NO_ERROR);
     Access::SetAccessControl(gPermissiveAccessControl);
-    VerifyOrDieWithMsg((err = Access::GetAccessControl().Init(chip::Access::Examples::GetPermissiveAccessControlDelegate(),
-                                                              gDeviceTypeResolver)) == CHIP_NO_ERROR,
-                       AppServer, "Init AccessControl failed: %" CHIP_ERROR_FORMAT, err.Format());
+    ASSERT_EQ(Access::GetAccessControl().Init(chip::Access::Examples::GetPermissiveAccessControlDelegate(), gDeviceTypeResolver),
+              CHIP_NO_ERROR);
 }
 
 void AppContext::TearDown()
 {
     Access::GetAccessControl().Finish();
     Access::ResetAccessControlToDefault();
     chip::app::InteractionModelEngine::GetInstance()->Shutdown();
+
     LoopbackMessagingContext::TearDown();
 }
 

src/app/tests/AppTestContext.h

@@ -32,9 +32,9 @@ class AppContext : public LoopbackMessagingContext
     // Performs shared teardown for all tests in the test suite
     static void TearDownTestSuite();
     // Performs setup for each individual test in the test suite
-    void SetUp();
+    virtual void SetUp();
     // Performs teardown for each individual test in the test suite
-    void TearDown();
+    virtual void TearDown();
 };
 
 } // namespace Test

src/app/tests/BUILD.gn

@@ -40,7 +40,10 @@ static_library("helpers") {
     "${chip_root}/src/transport/raw/tests:helpers",
   ]
 
-  public_deps = [ "${chip_root}/src/messaging/tests:helpers" ]
+  public_deps = [
+    "${chip_root}/src/lib/support/tests:pw-test-macros",
+    "${chip_root}/src/messaging/tests:helpers",
+  ]
 }
 
 source_set("binding-test-srcs") {

src/app/tests/TestAclAttribute.cpp

@@ -109,50 +109,31 @@ class MockInteractionModelApp : public chip::app::ReadClient::Callback
 namespace chip {
 namespace app {
 
-class TestAclAttribute : public ::testing::Test
+class TestAclAttribute : public Test::AppContext
 {
 public:
-    static void SetUpTestSuite()
-    {
-
-        mpTestContext = new chip::Test::AppContext;
-        mpTestContext->SetUpTestSuite();
-    }
-    static void TearDownTestSuite()
-    {
-        mpTestContext->TearDownTestSuite();
-        delete mpTestContext;
-    }
-
     void SetUp() override
     {
-        mpTestContext->SetUp();
+        AppContext::SetUp();
 
         Access::GetAccessControl().Finish();
         Access::GetAccessControl().Init(GetTestAccessControlDelegate(), gDeviceTypeResolver);
     }
-    void TearDown() override { mpTestContext->TearDown(); }
-
-    static chip::Test::AppContext * mpTestContext;
 };
 
-chip::Test::AppContext * TestAclAttribute::mpTestContext = nullptr;
-
 // Read Client sends a malformed subscribe request, interaction model engine fails to parse the request and generates a status
 // report to client, and client is closed.
 TEST_F(TestAclAttribute, TestACLDeniedAttribute)
 {
-    Messaging::ReliableMessageMgr * rm = mpTestContext->GetExchangeManager().GetReliableMessageMgr();
+    Messaging::ReliableMessageMgr * rm = GetExchangeManager().GetReliableMessageMgr();
     EXPECT_EQ(rm->TestGetCountRetransTable(), 0);
 
     MockInteractionModelApp delegate;
     auto * engine = chip::app::InteractionModelEngine::GetInstance();
-    EXPECT_EQ(engine->Init(&mpTestContext->GetExchangeManager(), &mpTestContext->GetFabricTable(),
-                           app::reporting::GetDefaultReportScheduler()),
-              CHIP_NO_ERROR);
+    EXPECT_EQ(engine->Init(&GetExchangeManager(), &GetFabricTable(), app::reporting::GetDefaultReportScheduler()), CHIP_NO_ERROR);
 
     {
-        app::ReadClient readClient(chip::app::InteractionModelEngine::GetInstance(), &mpTestContext->GetExchangeManager(), delegate,
+        app::ReadClient readClient(chip::app::InteractionModelEngine::GetInstance(), &GetExchangeManager(), delegate,
                                    chip::app::ReadClient::InteractionType::Subscribe);
 
         chip::app::AttributePathParams attributePathParams[2];
@@ -164,21 +145,21 @@ TEST_F(TestAclAttribute, TestACLDeniedAttribute)
         attributePathParams[1].mClusterId   = chip::Test::kTestDeniedClusterId1;
         attributePathParams[1].mAttributeId = 2;
 
-        ReadPrepareParams readPrepareParams(mpTestContext->GetSessionBobToAlice());
+        ReadPrepareParams readPrepareParams(GetSessionBobToAlice());
         readPrepareParams.mpAttributePathParamsList    = attributePathParams;
         readPrepareParams.mAttributePathParamsListSize = 2;
 
         EXPECT_EQ(readClient.SendRequest(readPrepareParams), CHIP_NO_ERROR);
 
-        mpTestContext->DrainAndServiceIO();
+        DrainAndServiceIO();
         EXPECT_EQ(delegate.mError, CHIP_IM_GLOBAL_STATUS(InvalidAction));
         EXPECT_FALSE(delegate.mGotReport);
         delegate.mError     = CHIP_NO_ERROR;
         delegate.mGotReport = false;
     }
 
     {
-        app::ReadClient readClient(chip::app::InteractionModelEngine::GetInstance(), &mpTestContext->GetExchangeManager(), delegate,
+        app::ReadClient readClient(chip::app::InteractionModelEngine::GetInstance(), &GetExchangeManager(), delegate,
                                    chip::app::ReadClient::InteractionType::Subscribe);
 
         chip::app::AttributePathParams attributePathParams[2];
@@ -189,21 +170,21 @@ TEST_F(TestAclAttribute, TestACLDeniedAttribute)
         attributePathParams[1].mClusterId   = chip::Test::kTestDeniedClusterId2;
         attributePathParams[1].mAttributeId = 2;
 
-        ReadPrepareParams readPrepareParams(mpTestContext->GetSessionBobToAlice());
+        ReadPrepareParams readPrepareParams(GetSessionBobToAlice());
         readPrepareParams.mpAttributePathParamsList    = attributePathParams;
         readPrepareParams.mAttributePathParamsListSize = 2;
 
         EXPECT_EQ(readClient.SendRequest(readPrepareParams), CHIP_NO_ERROR);
 
-        mpTestContext->DrainAndServiceIO();
+        DrainAndServiceIO();
         EXPECT_EQ(delegate.mError, CHIP_IM_GLOBAL_STATUS(InvalidAction));
         EXPECT_FALSE(delegate.mGotReport);
         delegate.mError     = CHIP_NO_ERROR;
         delegate.mGotReport = false;
     }
 
     {
-        app::ReadClient readClient(chip::app::InteractionModelEngine::GetInstance(), &mpTestContext->GetExchangeManager(), delegate,
+        app::ReadClient readClient(chip::app::InteractionModelEngine::GetInstance(), &GetExchangeManager(), delegate,
                                    chip::app::ReadClient::InteractionType::Subscribe);
 
         chip::app::AttributePathParams attributePathParams[2];
@@ -215,13 +196,13 @@ TEST_F(TestAclAttribute, TestACLDeniedAttribute)
         attributePathParams[1].mClusterId   = chip::Test::kTestClusterId;
         attributePathParams[1].mAttributeId = 2;
 
-        ReadPrepareParams readPrepareParams(mpTestContext->GetSessionBobToAlice());
+        ReadPrepareParams readPrepareParams(GetSessionBobToAlice());
         readPrepareParams.mpAttributePathParamsList    = attributePathParams;
         readPrepareParams.mAttributePathParamsListSize = 2;
 
         EXPECT_EQ(readClient.SendRequest(readPrepareParams), CHIP_NO_ERROR);
 
-        mpTestContext->DrainAndServiceIO();
+        DrainAndServiceIO();
         EXPECT_EQ(delegate.mError, CHIP_NO_ERROR);
         EXPECT_TRUE(delegate.mGotReport);
         EXPECT_EQ(engine->GetNumActiveReadHandlers(ReadHandler::InteractionType::Subscribe), 1u);
@@ -231,7 +212,7 @@ TEST_F(TestAclAttribute, TestACLDeniedAttribute)
 
     EXPECT_EQ(engine->GetNumActiveReadClients(), 0u);
     engine->Shutdown();
-    EXPECT_EQ(mpTestContext->GetExchangeManager().GetNumActiveExchanges(), 0u);
+    EXPECT_EQ(GetExchangeManager().GetNumActiveExchanges(), 0u);
 }
 } // namespace app
 } // namespace chip