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feasel0feasel0
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Removed unneeded scope from call to parent setup/teardown
1 parent d43b087 commit a02c9d7

15 files changed

+23
-31
lines changed

‎src/app/tests/TestAclAttribute.cpp

+2-2
Original file line numberDiff line numberDiff line change
@@ -109,12 +109,12 @@ class MockInteractionModelApp : public chip::app::ReadClient::Callback
109109
namespace chip {
110110
namespace app {
111111

112-
class TestAclAttribute : public chip::Test::AppContext
112+
class TestAclAttribute : public Test::AppContext
113113
{
114114
public:
115115
void SetUp() override
116116
{
117-
chip::Test::AppContext::SetUp();
117+
AppContext::SetUp();
118118

119119
Access::GetAccessControl().Finish();
120120
Access::GetAccessControl().Init(GetTestAccessControlDelegate(), gDeviceTypeResolver);

‎src/app/tests/TestAclEvent.cpp

+3-3
Original file line numberDiff line numberDiff line change
@@ -172,7 +172,7 @@ class MockInteractionModelApp : public chip::app::ReadClient::Callback
172172
namespace chip {
173173
namespace app {
174174

175-
class TestAclEvent : public chip::Test::AppContext
175+
class TestAclEvent : public Test::AppContext
176176
{
177177
public:
178178
// Performs setup for each individual test in the test suite
@@ -184,7 +184,7 @@ class TestAclEvent : public chip::Test::AppContext
184184
{ &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical },
185185
};
186186

187-
chip::Test::AppContext::SetUp();
187+
AppContext::SetUp();
188188

189189
ASSERT_EQ(mEventCounter.Init(0), CHIP_NO_ERROR);
190190
chip::app::EventManagement::CreateEventManagement(&GetExchangeManager(), ArraySize(logStorageResources),
@@ -198,7 +198,7 @@ class TestAclEvent : public chip::Test::AppContext
198198
void TearDown() override
199199
{
200200
chip::app::EventManagement::DestroyEventManagement();
201-
chip::Test::AppContext::TearDown();
201+
AppContext::TearDown();
202202
}
203203

204204
private:

‎src/app/tests/TestEventLogging.cpp

+2-2
Original file line numberDiff line numberDiff line change
@@ -65,7 +65,7 @@ class TestEventLogging : public chip::Test::AppContext
6565
{ &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical },
6666
};
6767

68-
chip::Test::AppContext::SetUp();
68+
AppContext::SetUp();
6969
ASSERT_EQ(mEventCounter.Init(0), CHIP_NO_ERROR);
7070
chip::app::EventManagement::CreateEventManagement(&GetExchangeManager(), ArraySize(logStorageResources),
7171
gCircularEventBuffer, logStorageResources, &mEventCounter);
@@ -75,7 +75,7 @@ class TestEventLogging : public chip::Test::AppContext
7575
void TearDown() override
7676
{
7777
chip::app::EventManagement::DestroyEventManagement();
78-
chip::Test::AppContext::TearDown();
78+
AppContext::TearDown();
7979
}
8080

8181
private:

‎src/app/tests/TestEventLoggingNoUTCTime.cpp

+4-4
Original file line numberDiff line numberDiff line change
@@ -79,15 +79,15 @@ class TestEventLoggingNoUTCTime : public chip::Test::AppContext
7979
// Performs shared setup for all tests in the test suite
8080
static void SetUpTestSuite()
8181
{
82-
chip::Test::AppContext::SetUpTestSuite();
82+
AppContext::SetUpTestSuite();
8383
sClock.Emplace(chip::System::SystemClock());
8484
}
8585

8686
// Performs shared teardown for all tests in the test suite
8787
static void TearDownTestSuite()
8888
{
8989
sClock.ClearValue();
90-
chip::Test::AppContext::TearDownTestSuite();
90+
AppContext::TearDownTestSuite();
9191
}
9292

9393
// Performs setup for each individual test in the test suite
@@ -99,7 +99,7 @@ class TestEventLoggingNoUTCTime : public chip::Test::AppContext
9999
{ &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical },
100100
};
101101

102-
chip::Test::AppContext::SetUp();
102+
AppContext::SetUp();
103103
ASSERT_EQ(mEventCounter.Init(0), CHIP_NO_ERROR);
104104
chip::app::EventManagement::CreateEventManagement(&GetExchangeManager(), ArraySize(logStorageResources),
105105
gCircularEventBuffer, logStorageResources, &mEventCounter);
@@ -109,7 +109,7 @@ class TestEventLoggingNoUTCTime : public chip::Test::AppContext
109109
void TearDown() override
110110
{
111111
chip::app::EventManagement::DestroyEventManagement();
112-
chip::Test::AppContext::TearDown();
112+
AppContext::TearDown();
113113
}
114114

115115
private:

‎src/app/tests/TestFabricScopedEventLogging.cpp

+2-2
Original file line numberDiff line numberDiff line change
@@ -65,7 +65,7 @@ class TestFabricScopedEventLogging : public chip::Test::AppContext
6565
{ &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical },
6666
};
6767

68-
chip::Test::AppContext::SetUp();
68+
AppContext::SetUp();
6969

7070
ASSERT_EQ(mEventCounter.Init(0), CHIP_NO_ERROR);
7171
chip::app::EventManagement::CreateEventManagement(&GetExchangeManager(), ArraySize(logStorageResources),
@@ -76,7 +76,7 @@ class TestFabricScopedEventLogging : public chip::Test::AppContext
7676
void TearDown() override
7777
{
7878
chip::app::EventManagement::DestroyEventManagement();
79-
chip::Test::AppContext::TearDown();
79+
AppContext::TearDown();
8080
}
8181

8282
private:

‎src/app/tests/TestReadInteraction.cpp

+4-4
Original file line numberDiff line numberDiff line change
@@ -236,7 +236,7 @@ class TestReadInteraction : public chip::Test::AppContext
236236
public:
237237
static void SetUpTestSuite()
238238
{
239-
chip::Test::AppContext::SetUpTestSuite();
239+
AppContext::SetUpTestSuite();
240240

241241
gRealClock = &chip::System::SystemClock();
242242
chip::System::Clock::Internal::SetSystemClockForTesting(&gMockClock);
@@ -255,7 +255,7 @@ class TestReadInteraction : public chip::Test::AppContext
255255
{
256256
chip::System::Clock::Internal::SetSystemClockForTesting(gRealClock);
257257

258-
chip::Test::AppContext::TearDownTestSuite();
258+
AppContext::TearDownTestSuite();
259259
}
260260

261261
void SetUp()
@@ -266,7 +266,7 @@ class TestReadInteraction : public chip::Test::AppContext
266266
{ &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical },
267267
};
268268

269-
chip::Test::AppContext::SetUp();
269+
AppContext::SetUp();
270270

271271
ASSERT_EQ(mEventCounter.Init(0), CHIP_NO_ERROR);
272272
chip::app::EventManagement::CreateEventManagement(&GetExchangeManager(), ArraySize(logStorageResources),
@@ -275,7 +275,7 @@ class TestReadInteraction : public chip::Test::AppContext
275275
void TearDown()
276276
{
277277
chip::app::EventManagement::DestroyEventManagement();
278-
chip::Test::AppContext::TearDown();
278+
AppContext::TearDown();
279279
}
280280

281281
void TestReadClient();

‎src/app/tests/TestWriteInteraction.cpp

+2-2
Original file line numberDiff line numberDiff line change
@@ -58,7 +58,7 @@ class TestWriteInteraction : public chip::Test::AppContext
5858
public:
5959
void SetUp() override
6060
{
61-
chip::Test::AppContext::SetUp();
61+
AppContext::SetUp();
6262

6363
gTestStorage.ClearStorage();
6464
gGroupsProvider.SetStorageDelegate(&gTestStorage);
@@ -78,7 +78,7 @@ class TestWriteInteraction : public chip::Test::AppContext
7878
{
7979
provider->Finish();
8080
}
81-
chip::Test::AppContext::TearDown();
81+
AppContext::TearDown();
8282
}
8383

8484
void TestWriteClient();

‎src/controller/tests/TestEventChunking.cpp

+2-3
Original file line numberDiff line numberDiff line change
@@ -41,7 +41,6 @@
4141
#include <lib/support/CHIPCounter.h>
4242
#include <lib/support/TimeUtils.h>
4343
#include <lib/support/logging/CHIPLogging.h>
44-
#include <messaging/tests/MessagingContext.h>
4544

4645
using namespace chip;
4746
using namespace chip::app;
@@ -79,7 +78,7 @@ class TestEventChunking : public chip::Test::AppContext
7978
{ &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical },
8079
};
8180

82-
chip::Test::AppContext::SetUp();
81+
AppContext::SetUp();
8382

8483
CHIP_ERROR err = CHIP_NO_ERROR;
8584
// TODO: use ASSERT_EQ, once transition to pw_unit_test is complete
@@ -93,7 +92,7 @@ class TestEventChunking : public chip::Test::AppContext
9392
void TearDown()
9493
{
9594
chip::app::EventManagement::DestroyEventManagement();
96-
chip::Test::AppContext::TearDown();
95+
AppContext::TearDown();
9796
}
9897

9998
private:

‎src/controller/tests/TestEventNumberCaching.cpp

+2-3
Original file line numberDiff line numberDiff line change
@@ -33,7 +33,6 @@
3333
#include <lib/core/ErrorStr.h>
3434
#include <lib/support/TimeUtils.h>
3535
#include <lib/support/logging/CHIPLogging.h>
36-
#include <messaging/tests/MessagingContext.h>
3736

3837
using namespace chip;
3938
using namespace chip::app;
@@ -65,7 +64,7 @@ class TestEventNumberCaching : public chip::Test::AppContext
6564
{ &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical },
6665
};
6766

68-
chip::Test::AppContext::SetUp();
67+
AppContext::SetUp();
6968

7069
CHIP_ERROR err = CHIP_NO_ERROR;
7170
// TODO: use ASSERT_EQ, once transition to pw_unit_test is complete
@@ -79,7 +78,7 @@ class TestEventNumberCaching : public chip::Test::AppContext
7978
void TearDown()
8079
{
8180
chip::app::EventManagement::DestroyEventManagement();
82-
chip::Test::AppContext::TearDown();
81+
AppContext::TearDown();
8382
}
8483

8584
private:

‎src/controller/tests/TestReadChunking.cpp

-1
Original file line numberDiff line numberDiff line change
@@ -44,7 +44,6 @@
4444
#include <lib/support/TimeUtils.h>
4545
#include <lib/support/UnitTestUtils.h>
4646
#include <lib/support/logging/CHIPLogging.h>
47-
#include <messaging/tests/MessagingContext.h>
4847

4948
using namespace chip;
5049
using namespace chip::app;

‎src/controller/tests/TestServerCommandDispatch.cpp

-1
Original file line numberDiff line numberDiff line change
@@ -36,7 +36,6 @@
3636
#include <controller/ReadInteraction.h>
3737
#include <lib/core/ErrorStr.h>
3838
#include <lib/support/logging/CHIPLogging.h>
39-
#include <messaging/tests/MessagingContext.h>
4039

4140
using namespace chip;
4241
using namespace chip::app;

‎src/controller/tests/TestWriteChunking.cpp

-1
Original file line numberDiff line numberDiff line change
@@ -36,7 +36,6 @@
3636
#include <controller/InvokeInteraction.h>
3737
#include <lib/core/ErrorStr.h>
3838
#include <lib/support/logging/CHIPLogging.h>
39-
#include <messaging/tests/MessagingContext.h>
4039

4140
using namespace chip;
4241
using namespace chip::app;

‎src/controller/tests/data_model/TestCommands.cpp

-1
Original file line numberDiff line numberDiff line change
@@ -35,7 +35,6 @@
3535
#include <lib/core/TLV.h>
3636
#include <lib/core/TLVUtilities.h>
3737
#include <lib/support/logging/CHIPLogging.h>
38-
#include <messaging/tests/MessagingContext.h>
3938
#include <protocols/interaction_model/Constants.h>
4039
#include <protocols/interaction_model/StatusCode.h>
4140

‎src/controller/tests/data_model/TestRead.cpp

-1
Original file line numberDiff line numberDiff line change
@@ -31,7 +31,6 @@
3131
#include <controller/ReadInteraction.h>
3232
#include <lib/core/ErrorStr.h>
3333
#include <lib/support/logging/CHIPLogging.h>
34-
#include <messaging/tests/MessagingContext.h>
3534
#include <protocols/interaction_model/Constants.h>
3635

3736
using namespace chip;

‎src/controller/tests/data_model/TestWrite.cpp

-1
Original file line numberDiff line numberDiff line change
@@ -27,7 +27,6 @@
2727
#include <controller/WriteInteraction.h>
2828
#include <lib/core/ErrorStr.h>
2929
#include <lib/support/logging/CHIPLogging.h>
30-
#include <messaging/tests/MessagingContext.h>
3130
#include <protocols/interaction_model/Constants.h>
3231

3332
using namespace chip;

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