Chunk 2

Author: jlatusek

src/credentials/tests/BUILD.gn

@@ -51,13 +51,13 @@ chip_test_suite("tests") {
     "TestDeviceAttestationConstruction.cpp",
     "TestDeviceAttestationCredentials.cpp",
     "TestFabricTable.cpp",
-    # "TestGroupDataProvider.cpp",
-    # "TestPersistentStorageOpCertStore.cpp",
+    "TestGroupDataProvider.cpp",
+    "TestPersistentStorageOpCertStore.cpp",
   ]
 
   # DUTVectors test requires <dirent.h> which is not supported on all platforms
   if (chip_device_platform != "openiotsdk" && chip_device_platform != "nxp") {
-    # test_sources += [ "TestCommissionerDUTVectors.cpp" ]
+    test_sources += [ "TestCommissionerDUTVectors.cpp" ]
   }
 
   cflags = [ "-Wconversion" ]

src/credentials/tests/TestChipCert.cpp

@@ -166,7 +166,7 @@ struct TestChipCert : public ::testing::Test
     static void SetUpTestSuite()
     {
         CHIP_ERROR error = chip::Platform::MemoryInit();
-		EXPECT_EQ(error, CHIP_NO_ERROR);
+        EXPECT_EQ(error, CHIP_NO_ERROR);
     }
     static void TearDownTestSuite() { chip::Platform::MemoryShutdown(); }
 };
@@ -2190,11 +2190,11 @@ TEST_F(TestChipCert, TestChipCert_PDCIdentityGeneration)
 TEST_F(TestChipCert, TestChipCert_KeypairConversion)
 {
     P256SerializedKeypair keypair;
-    EXPECT_EQ( GetTestCertKeypair(kPDCID01, keypair), CHIP_NO_ERROR);
+    EXPECT_EQ(GetTestCertKeypair(kPDCID01, keypair), CHIP_NO_ERROR);
 
     uint8_t buffer[kP256ECPrivateKeyDERLength];
     MutableByteSpan keypairDer(buffer);
-    EXPECT_EQ( ConvertECDSAKeypairRawToDER(keypair, keypairDer), CHIP_NO_ERROR);
+    EXPECT_EQ(ConvertECDSAKeypairRawToDER(keypair, keypairDer), CHIP_NO_ERROR);
 
     // Technically the curve name and public key are optional in the DER format,
     // but both our code and standard tools include them, so we can just compare.

src/credentials/tests/TestCommissionerDUTVectors.cpp

@@ -29,10 +29,8 @@
 #include <lib/core/CHIPError.h>
 #include <lib/support/CHIPMem.h>
 #include <lib/support/Span.h>
-#include <lib/support/UnitTestExtendedAssertions.h>
-#include <lib/support/UnitTestRegistration.h>
 
-#include <nlunit-test.h>
+#include <gtest/gtest.h>
 
 #include <dirent.h>
 #include <stdio.h>
@@ -49,10 +47,21 @@ static void OnAttestationInformationVerificationCallback(void * context, const D
     *pResult                                = result;
 }
 
-static void TestCommissionerDUTVectors(nlTestSuite * inSuite, void * inContext)
+struct TestCommissionerDUTVectors : public ::testing::Test
+{
+    static void SetUpTestSuite()
+    {
+        CHIP_ERROR error = chip::Platform::MemoryInit();
+        EXPECT_EQ(error, CHIP_NO_ERROR);
+    }
+
+    static void TearDownTestSuite() { chip::Platform::MemoryShutdown(); }
+};
+
+TEST_F(TestCommissionerDUTVectors, TestCommissionerDUTVectors)
 {
     DeviceAttestationVerifier * example_dac_verifier = GetDefaultDACVerifier(GetTestAttestationTrustStore());
-    NL_TEST_ASSERT(inSuite, example_dac_verifier != nullptr);
+    EXPECT_NE(example_dac_verifier, nullptr);
 
     std::string dirPath("../../../../../credentials/development/commissioner_dut/");
     DIR * dir = opendir(dirPath.c_str());
@@ -105,14 +114,14 @@ static void TestCommissionerDUTVectors(nlTestSuite * inSuite, void * inContext)
         VendorId vid = TestVendor1;
         uint16_t pid = strstr(entry->d_name, "_vidpid_fallback_encoding_") ? 0x00B1 : 0x8000;
 
-        NL_TEST_ASSERT_SUCCESS(inSuite, dacProvider.GetCertificationDeclaration(certDeclSpan));
-        NL_TEST_ASSERT_SUCCESS(inSuite, dacProvider.GetDeviceAttestationCert(dacCertSpan));
-        NL_TEST_ASSERT_SUCCESS(inSuite, dacProvider.GetProductAttestationIntermediateCert(paiCertSpan));
+        EXPECT_EQ(dacProvider.GetCertificationDeclaration(certDeclSpan), CHIP_NO_ERROR);
+        EXPECT_EQ(dacProvider.GetDeviceAttestationCert(dacCertSpan), CHIP_NO_ERROR);
+        EXPECT_EQ(dacProvider.GetProductAttestationIntermediateCert(paiCertSpan), CHIP_NO_ERROR);
 
         size_t attestationElementsLen =
             TLV::EstimateStructOverhead(certDeclSpan.size(), attestationNonceSpan.size(), sizeof(uint64_t) * 8);
         Platform::ScopedMemoryBuffer<uint8_t> attestationElements;
-        NL_TEST_ASSERT(inSuite, attestationElements.Alloc(attestationElementsLen + attestationChallengeSpan.size()));
+        EXPECT_TRUE(attestationElements.Alloc(attestationElementsLen + attestationChallengeSpan.size()));
         MutableByteSpan attestationElementsSpan(attestationElements.Get(), attestationElementsLen);
 
         // Construct attestation elements
@@ -121,10 +130,9 @@ static void TestCommissionerDUTVectors(nlTestSuite * inSuite, void * inContext)
             Credentials::DeviceAttestationVendorReservedConstructor emptyVendorReserved(nullptr, 0);
             const ByteSpan kEmptyFirmwareInfo;
 
-            NL_TEST_ASSERT_SUCCESS(inSuite,
-                                   Credentials::ConstructAttestationElements(certDeclSpan, attestationNonceSpan, timestamp,
-                                                                             kEmptyFirmwareInfo, emptyVendorReserved,
-                                                                             attestationElementsSpan));
+            EXPECT_EQ(Credentials::ConstructAttestationElements(certDeclSpan, attestationNonceSpan, timestamp, kEmptyFirmwareInfo,
+                                                                emptyVendorReserved, attestationElementsSpan),
+                      CHIP_NO_ERROR);
         }
 
         // Generate attestation signature
@@ -134,8 +142,8 @@ static void TestCommissionerDUTVectors(nlTestSuite * inSuite, void * inContext)
                    attestationChallengeSpan.size());
             ByteSpan tbsSpan(attestationElementsSpan.data(), attestationElementsSpan.size() + attestationChallengeSpan.size());
 
-            NL_TEST_ASSERT_SUCCESS(inSuite, dacProvider.SignWithDeviceAttestationKey(tbsSpan, attestationSignatureSpan));
-            NL_TEST_ASSERT(inSuite, attestationSignatureSpan.size() == signature.Capacity());
+            EXPECT_EQ(dacProvider.SignWithDeviceAttestationKey(tbsSpan, attestationSignatureSpan), CHIP_NO_ERROR);
+            EXPECT_EQ(attestationSignatureSpan.size(), signature.Capacity());
         }
 
         AttestationVerificationResult attestationResult = AttestationVerificationResult::kNotImplemented;
@@ -167,63 +175,12 @@ static void TestCommissionerDUTVectors(nlTestSuite * inSuite, void * inContext)
 
         if (isSuccessCase)
         {
-            NL_TEST_ASSERT(inSuite, attestationResult == AttestationVerificationResult::kSuccess);
+            EXPECT_EQ(attestationResult, AttestationVerificationResult::kSuccess);
         }
         else
         {
-            NL_TEST_ASSERT(inSuite, attestationResult != AttestationVerificationResult::kSuccess);
+            EXPECT_NE(attestationResult, AttestationVerificationResult::kSuccess);
         }
     }
     closedir(dir);
 }
-
-/**
- *  Set up the test suite.
- */
-int TestCommissionerDUT_Setup(void * inContext)
-{
-    CHIP_ERROR error = chip::Platform::MemoryInit();
-
-    if (error != CHIP_NO_ERROR)
-    {
-        return FAILURE;
-    }
-
-    return SUCCESS;
-}
-
-/**
- *  Tear down the test suite.
- */
-int TestCommissionerDUT_Teardown(void * inContext)
-{
-    chip::Platform::MemoryShutdown();
-    return SUCCESS;
-}
-
-/**
- *   Test Suite. It lists all the test functions.
- */
-// clang-format off
-static const nlTest sTests[] = {
-    NL_TEST_DEF("Test Device Attestation Credentials Vectors", TestCommissionerDUTVectors),
-    NL_TEST_SENTINEL()
-};
-// clang-format on
-
-int TestCommissionerDUT()
-{
-    // clang-format off
-    nlTestSuite theSuite =
-    {
-        "Device Attestation Credentials Test Vectors",
-        &sTests[0],
-        TestCommissionerDUT_Setup,
-        TestCommissionerDUT_Teardown
-    };
-    // clang-format on
-    nlTestRunner(&theSuite, nullptr);
-    return (nlTestRunnerStats(&theSuite));
-}
-
-CHIP_REGISTER_TEST_SUITE(TestCommissionerDUT);