@@ -123,6 +123,7 @@ chip_test_suite_using_nltest("tests") {
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output_name = " libAppTests"
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test_sources = [
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+ " TestAclAttribute.cpp" ,
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" TestAclEvent.cpp" ,
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" TestAttributeAccessInterfaceCache.cpp" ,
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" TestAttributePathExpandIterator.cpp" ,
@@ -151,6 +152,7 @@ chip_test_suite_using_nltest("tests") {
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" TestPendingResponseTrackerImpl.cpp" ,
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" TestPowerSourceCluster.cpp" ,
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" TestReadInteraction.cpp" ,
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+ " TestReportScheduler.cpp" ,
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" TestReportingEngine.cpp" ,
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" TestStatusIB.cpp" ,
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" TestStatusResponseMessage.cpp" ,
@@ -164,8 +166,6 @@ chip_test_suite_using_nltest("tests") {
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test_sources += [ " TestFailSafeContext.cpp" ]
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}
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- test_sources += [ " TestAclAttribute.cpp" ]
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-
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# DefaultICDClientStorage assumes that raw AES key is used by the application
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if (chip_crypto != " psa" ) {
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test_sources += [ " TestDefaultICDClientStorage.cpp" ]
@@ -189,16 +189,6 @@ chip_test_suite_using_nltest("tests") {
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test_sources += [ " TestEventLogging.cpp" ]
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}
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- # The platform manager is not properly clearing queues in test teardown, which results in
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- # DrainIO calls not being able to run in expected time (5seconds) if unprocessed reported engine
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- # runs are remaining, causing tests to crash in Open IoT SDK and Zephyr tests since they are
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- # running all tests in one file. We need to figure out how to properly clean the event queues
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- # before enabling this test for these platforms.
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- if (chip_device_platform != " nrfconnect" &&
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- chip_device_platform != " openiotsdk" ) {
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- test_sources += [ " TestReportScheduler.cpp" ]
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- }
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-
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cflags = [ " -Wconversion" ]
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public_deps = [
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