Refactor batched serial pttrf implementation details and tests #2530
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lucbv
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Mar 11, 2025
| @@ -270,13 +241,11 @@ void impl_test_batched_pttrf_quick_return(const int N, const int BlkSize) { | |||
| EXPECT_EQ(info, 0); | |||
| EXPECT_EQ(info2, expected_info2); | |||
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| // this eps is about 10^-14 | |||
| RealType eps = 1.0e3 * ats::epsilon(); | |||
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It is kind of bothering that there was no error analysis performed here to decide what the appropriate epsilon should be...
| } | ||
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| inline int run() { | ||
| using value_type = typename DViewType::non_const_value_type; | ||
| using value_type = typename EViewType::non_const_value_type; |
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I am guessing that both D and E ViewType are actually storing the same scalars? Any reason why this needs to change?
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Actually, E can be real or complex while D is always a real type. (see the implementation of zpttrf)
So, we need to use the value type of E here
added 4 commits
March 12, 2025 21:40
Signed-off-by: Yuuichi Asahi <y.asahi@nr.titech.ac.jp>
Signed-off-by: Yuuichi Asahi <y.asahi@nr.titech.ac.jp>
Signed-off-by: Yuuichi Asahi <y.asahi@nr.titech.ac.jp>
Signed-off-by: Yuuichi Asahi <y.asahi@nr.titech.ac.jp>
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@lucbv To me, the error analysis is more relevant in gemm testing for fp16. |
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This PR aims at improving the implementation and testing of serial
pttrf.Implnamespace.using namespace KokkosBatchedfrom the test codeTest_Batched_SerialPttrf_Real.hppandTest_Batched_SerialPttrf_Complex.hppintoTest_Batched_SerialPttrf.hpp.Argtemplate parameters